ST Series Leaf Temperature Probe

ST Series
  • Easy to insert between objects to be measured
  • Chemical-resistance
  • Noise immunity
  • Measure -50 to 400 C deg (-58 to 752 F)

STN Series Replaceable Leaf Temperature Probe

STN Series
  • Replaceable leaf probe
  • Chemical-resistance
  • Noise immunity
  • Measure -50 to 400 C deg (-58 to 752 F)

AW Series The High-Precision Silicon Wafer with Thermocouple Sensors

AW Series

The high-precision silicon wafers with thermocouples for the development of semiconductor manufacturing equipment, process condition setting, and temperature distribution measurement.

SC series

CR series

Soldering iron probe

502, 503, 504, 505, 518, 524, 540 series

Flat leaf insertion probe